Amanote Research
Register
Sign In
Discover open access scientific publications
Search, annotate, share and cite publications
Publications by Yukio Mitsuyama
Neutron-Induced Soft Errors and Multiple Cell Upsets in 65-Nm 10T Subthreshold SRAM
IEEE Transactions on Nuclear Science
Electronic Engineering
Nuclear
Nuclear Energy
High Energy Physics
Engineering
Electrical
Adaptive Performance Compensation With In-Situ Timing Error Prediction for Subthreshold Circuits
Related publications
Multiple-Cell-Upsets on a Commercial 90nm SRAM in Dynamic Mode
Heavy-Ion Induced Single Event Upsets in Advanced 65 Nm Radiation Hardened FPGAs
Electronics (Switzerland)
Control
Electronic Engineering
Signal Processing
Computer Networks
Systems Engineering
Hardware
Communications
Electrical
Architecture
Analysis of 8T SRAM Cell at Various Process Corners at 65 Nm Process Technology
Circuits and Systems
Single Event Upsets Under 14-MeV Neutrons in a 28-Nm SRAM-based FPGA in Static Mode
IEEE Transactions on Nuclear Science
Electronic Engineering
Nuclear
Nuclear Energy
High Energy Physics
Engineering
Electrical
Leakage Immune Modified Pass Transistor Based 8T SRAM Cell in Subthreshold Region
International Journal of Reconfigurable Computing
Hardware
Architecture
Multiple Cell Upsets Correction for OLS Codes
International Journal of Advanced Research in Electrical, Electronics and Instrumentation Engineering
IPF: In-Place X-Filling to Mitigate Soft Errors in SRAM-Based FPGAs
Doorway Parameters of the Resonances in Subthreshold Neutron-Induced Fission
Nuclear Physics A
High Energy Physics
Nuclear
Comparative Analysis of 6T, 7T, 8T, 9T, and 10T Realistic CNTFET Based SRAM
Journal of Nanotechnology
Materials Science
