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Recent Trends in CMOS Reliability: From Individual Traps to Circuit Simulations
doi 10.1109/iirw.2011.6142582
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Date
October 1, 2011
Authors
B. Kaczer
M. Toledano-Luque
J. Franco
T. Grasser
J. Roussel
V. V. A. Camargo
S. Mahato
E. Simoen
F. Catthoor
G. I. Wirth
G. Groeseneken
Publisher
IEEE
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