Correction To: “Measuring the Speed of Data Exchange in Memory Cards Using Programmable Logic Integrated Circuits”

Measurement Techniques - United States
doi 10.1007/s11018-020-01726-y
Full Text
Abstract

Available in full text

Date
Authors
Publisher

Springer Science and Business Media LLC

Related search

Logic Testing of Bridging Faults in CMOS Integrated Circuits

IEEE Transactions on Computers
HardwareArchitectureMathematicsComputational TheoryTheoretical Computer ScienceSoftware
1998English

Performance Analysis of High Speed Domino CMOS Logic Circuits

International Journal of Computer Applications
2014English

Memristors: Memristive Logic-In-Memory Integrated Circuits for Energy-Efficient Flexible Electronics (Adv. Funct. Mater. 2/2018)

Advanced Functional Materials
Materials ScienceCondensed Matter PhysicsElectrochemistryNanoscienceOpticalBiomaterialsMagnetic MaterialsNanotechnologyChemistryElectronic
2018English

Integrated Programmable Waveguide Circuits for Classical and Quantum Photonic Processing

English

Distributed ESD Protection for High-Speed Integrated Circuits

IEEE Electron Device Letters
Electronic EngineeringOpticalElectricalMagnetic MaterialsElectronic
2000English

CMOS-based Carbon Nanotube Pass-Transistor Logic Integrated Circuits

Nature Communications
AstronomyGeneticsMolecular BiologyBiochemistryChemistryPhysics
2012English

Programmable Logic Controllers

2012English

Programmable Neural Logic

English

Design of On-Chip Testing Memory for High Speed Circuits

CVR Journal of Science & Technology
2014English

Amanote Research

Note-taking for researchers

Follow Amanote

© 2026 Amaplex Software S.P.R.L. All rights reserved.

Privacy PolicyRefund Policy