A Versatile CMOS Transistor Array IC for the Statistical Characterization of Time-Zero Variability, RTN, BTI, and HCI
IEEE Journal of Solid-State Circuits - United States
doi 10.1109/jssc.2018.2881923
Full Text
Open PDFAbstract
Available in full text
Date
February 1, 2019
Authors
Publisher
Institute of Electrical and Electronics Engineers (IEEE)