Large Leakage Current Reduction of Silicon Oxide and High-K Oxides Using the Phonon-Energy-Coupling Enhancement Effect

doi 10.1109/isdrs.2007.4422242
Full Text
Abstract

Available in full text

Date
Authors
Publisher

IEEE

Related search

Theoretical Study on Leakage Current in MOS With High-K Dielectric Stack: Effects of In-Plane-Longitudinal Kinetic Energy Coupling and Anisotropic Masses

Transactions of the Materials Research Society of Japan
2009English

Leakage Current Reduction Using Subthreshold Source-Coupled Logic

IEEE Transactions on Circuits and Systems II: Express Briefs
Electronic EngineeringElectrical
2009English

Phonon-Coupled Trap-Assisted Charge Injection in Metal-Nitride-Oxide-Silicon/Silicon-Oxide-Nitride-Oxide-Silicon Structures

Journal of Applied Physics
AstronomyPhysics
2009English

Ytterbium-Driven Strong Enhancement of Electron-Phonon Coupling in Graphene

Physical Review B
2014English

Modelling and Optimization of Subthreshold Leakage Current in Low-Power, Silicon-Based, Complementary Metal Oxide Semiconductor (Cmos) Devices

International Journal of Engineering Applied Sciences and Technology
2019English

Effects From the Reduction of Air Leakage on Energy and Durability

2014English

Effect of Intravalley Acoustic Phonon Scattering on Quantum Transport in Multigate Silicon Nanowire Metal-Oxide-Semiconductor Field-Effect Transistors

Journal of Applied Physics
AstronomyPhysics
2010English

Failure Analysis Using IDD Current Leakage and Photo Localization for Gate Oxide Defect of CMOS VLSI

2010English

Atomistic Modeling of Electron-Phonon Coupling and Transport Properties Inn-Type [110] Silicon Nanowires

Physical Review B
2010English

Amanote Research

Note-taking for researchers

Follow Amanote

© 2024 Amaplex Software S.P.R.L. All rights reserved.

Privacy PolicyRefund Policy