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Publications by C.-L. Chang
Diagnostic Test-Pattern Generation Targeting Open-Segment Defects and Its Diagnosis Flow
IET Computers and Digital Techniques
Hardware
Electronic Engineering
Electrical
Architecture
Software
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Multiple-Fault Diagnosis Based on Adaptive Diagnostic Test Pattern Generation
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On Adaptive Diagnostic Test Generation
Diagnosis of Full Open Defects in Interconnecting Lines
25th IEEE VLSI Test Symmposium (VTS'07)
Postbond Test of Through-Silicon Vias With Resistive Open Defects
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NeuroPG: Open Source Software for Optical Pattern Generation and Data Acquisition
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Antinuclear Factor (ANF) Test--Its Diagnostic Value
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Ring Counter Based ATPG for Low Transition Test Pattern Generation
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Fourier Analysis-Based Automatic Test Pattern Generation for Combinational Circuits
TESTCHIP: A Chip for Weighted Random Pattern Generation, Evaluation, and Test Control
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