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Publications by Dan Huber
Examining Foil Sidewall Damage During TEM Sample Preparation Using Gallium FIB and Needle Geometries
Microscopy and Microanalysis
Instrumentation
Analysis of Deformation Substructures in a Notched LCF Sample Under Dwell Condition in a Ni-Based Superalloy (PREPRINT)
Related publications
FIB TEM Sample Preparation of Deeply Buried Interfaces
Microscopy and Microanalysis
Instrumentation
FIB Dual-Beam Sample Preparation for TEM Observation
Microscopy and Microanalysis
Instrumentation
Ultra-Thin TEM Sample Preparation With Advanced Backside FIB Milling Method
Microscopy and Microanalysis
Instrumentation
Comparison of Fib Tem Specimen Preparation Methods
Microscopy and Microanalysis
Instrumentation
FIB Damage Reduction Technique in TEM Membrane Using Triple Beam System
Microscopy and Microanalysis
Instrumentation
Planarization Processes for Pre-Fib Sample Preparation
Microscopy and Microanalysis
Instrumentation
A Newly Developed Fib System for Tem Specimen Preparation
Microscopy and Microanalysis
Instrumentation
Specimen Preparation Methods With FIB for In-Situ TEM Observations in Materials Science^|^mdash;TEM Specimen Preparation by FIB With Glass Manipulator^|^mdash;
Materia Japan
TEM Foil Preparation From Irradiated Metallic Materials: A Practical Approach
Journal of Environmental Science and Engineering B
