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Publications by Elena Atanassova
Frequency Dependence of C-V Characteristics of MOS Capacitors Containing Nanosized High-Κ Ta2O5 Dielectrics
Advances in Materials Science and Engineering
Materials Science
Engineering
Related publications
Quantum Simulation of C-V and I-V Characteristics in Ge and III-V Materials/High-Κ MOS Devices
Materials Research Society Symposium - Proceedings
Mechanics of Materials
Materials Science
Condensed Matter Physics
Mechanical Engineering
A Real-Time C-V Measurement Circuit for MOS Capacitors Under Current Stressing
IEEE Transactions on Instrumentation and Measurement
Electronic Engineering
Electrical
Instrumentation
Thickness Mapping of High-Κ Dielectrics at the Nanoscale
Applied Physics Letters
Astronomy
Physics
Capacitance-Frequency Estimates of Border-Trap Densities in Multi-Fin MOS Capacitors
IEEE Transactions on Nuclear Science
Electronic Engineering
Nuclear
Nuclear Energy
High Energy Physics
Engineering
Electrical
High-Performance MIM Capacitors Using a High-Κ TiZrO Dielectric
Journal of the Electrochemical Society
Surfaces
Condensed Matter Physics
Optical
Electrochemistry
Sustainability
Materials Chemistry
Magnetic Materials
Renewable Energy
Films
Coatings
Electronic
the Environment
Characterization, Preparation& Analysis of Oxide Based Capacitors for Gate of Mos Characteristics
International Journal of Advance Engineering and Research Development
Charge Trapping Control in MOS Capacitors
IEEE Transactions on Industrial Electronics
Control
Systems Engineering
Computer Science Applications
Electrical
Electronic Engineering
Use of High-Field Electron Injection Into Dielectrics to Enhance Functional Capabilities of Radiation MOS Sensors
Sensors
Instrumentation
Information Systems
Electronic Engineering
Biochemistry
Analytical Chemistry
Molecular Physics,
Electrical
Atomic
Medicine
Optics
Tunable High-Κ ZrxAl1−xOy Thin Film Dielectrics From All-Inorganic Aqueous Precursor Solutions
RSC Advances
Chemistry
Chemical Engineering
