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Publications by Hidekazu Tsuchida

Photoluminescence Imaging and Wavelength Analysis of Basal Plane Frank-Type Defects in 4h-SiC Epilayers

Materials Science Forum

English

Forward Voltage Degradation of 4h-SiC Pin Diodes and High Voltage 4h-SiC Pin Diodes on the (000-1) C-Face With Reduced Forward Degradation

IEEJ Transactions on Industry Applications

Electronic Engineering

Manufacturing Engineering

English