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Publications by Jean-Marie Lauenstein
Unifying Concepts for Ion-Induced Leakage Current Degradation in Silicon Carbide Schottky Power Diodes
IEEE Transactions on Nuclear Science
Electronic Engineering
Nuclear
Nuclear Energy
High Energy Physics
Engineering
Electrical
Related publications
Junction Investigation of Graphene/Silicon Schottky Diodes
Nanoscale Research Letters
Materials Science
Nanotechnology
Condensed Matter Physics
Nanoscience
Ultralow Reverse Leakage Current in AlGaN/GaN Lateral Schottky Barrier Diodes Grown on Bulk GaN Substrate
Applied Physics Express
Engineering
Astronomy
Physics
Combined Thermionic Emission and Tunneling Mechanisms for the Analysis of the Leakage Current for Ga2O3 Schottky Barrier Diodes
SN Applied Sciences
Polishing Silicon Modification Layer on Silicon Carbide Surface by Ion Beam Figuring
Chinese Optics Letters
Electronic Engineering
Optics
Molecular Physics,
Optical
Electrical
Atomic
Magnetic Materials
Electronic
Large Reduction of Leakage Currents in AlGaN Schottky Diodes by a Surface Control Process and Its Mechanism
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
Silicon Carbide as a Photoconductive Switch Material for High Power Applications
Unifying Leakage Models: From Probing Attacks to Noisy Leakage
Journal of Cryptology
Applied Mathematics
Computer Science Applications
Software
Shot-Noise Suppression in Schottky Barrier Diodes
Journal of Applied Physics
Astronomy
Physics
Modelling and Optimization of Subthreshold Leakage Current in Low-Power, Silicon-Based, Complementary Metal Oxide Semiconductor (Cmos) Devices
International Journal of Engineering Applied Sciences and Technology
