Amanote Research
Register
Sign In
Discover open access scientific publications
Search, annotate, share and cite publications
Publications by M Rye
FIB TEM Sample Preparation of Deeply Buried Interfaces
Microscopy and Microanalysis
Instrumentation
Related publications
FIB Dual-Beam Sample Preparation for TEM Observation
Microscopy and Microanalysis
Instrumentation
Ultra-Thin TEM Sample Preparation With Advanced Backside FIB Milling Method
Microscopy and Microanalysis
Instrumentation
Comparison of Fib Tem Specimen Preparation Methods
Microscopy and Microanalysis
Instrumentation
Examining Foil Sidewall Damage During TEM Sample Preparation Using Gallium FIB and Needle Geometries
Microscopy and Microanalysis
Instrumentation
Planarization Processes for Pre-Fib Sample Preparation
Microscopy and Microanalysis
Instrumentation
A Newly Developed Fib System for Tem Specimen Preparation
Microscopy and Microanalysis
Instrumentation
Specimen Preparation Methods With FIB for In-Situ TEM Observations in Materials Science^|^mdash;TEM Specimen Preparation by FIB With Glass Manipulator^|^mdash;
Materia Japan
Advances in Dual Beam TEM Sample Preparation
Microscopy and Microanalysis
Instrumentation
TEM Sample Preparation for Microcompressed Nanocrystalline Ni
Materials Transactions
Mechanics of Materials
Materials Science
Condensed Matter Physics
Mechanical Engineering