Amanote Research
Register
Sign In
Discover open access scientific publications
Search, annotate, share and cite publications
Publications by N. Daval
Atomic Scale Thickness Control of SOI Wafers for Fully Depleted Applications
ECS Transactions
Engineering
Progress and Challenges in the Direct Monolithic Integration of III–V Devices and Si CMOS on Silicon Substrates
Related publications
Double-Gate Fully-Depleted SOI Transistors for Low-Power High-Performance Nano-Scale Circuit Design
A Back-Illuminated Time-Of-Flight Image Sensor With SOI-Based Fully Depleted Detector Technology for LiDAR Application
Proceedings
Implant Metrology for Bonded SOI Wafers Using a Surface Photo-Voltage Technique
Very Low Energy Implanted Bragg Gratings in SOI for Wafer Scale Testing Applications
Challenges of Smaller Particle Detection on Both Bulk-Silicon and SOI Wafers
AIP Conference Proceedings
Astronomy
Physics
Modeling and Control of State-Affine Probabilistic Systems for Atomic-Scale Dynamics
Fully Integrated SOI Wavelength Meter Based on Phase Shift Technique
Atomic Scale Catalysts: Atomic Scale Materials for Emerging Robust Catalysis (Small Methods 11/2018)
Small Methods
Materials Science
Chemistry
Compact Threshold-Voltage Model for Short-Channel Partially-Depleted (PD) SOI Dynamic-Threshold MOS (DTMOS) Devices
IEEE Transactions on Electron Devices
Electronic Engineering
Optical
Electrical
Magnetic Materials
Electronic
