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Publications by P.-E. Acosta-Alba

Atomic Scale Thickness Control of SOI Wafers for Fully Depleted Applications

ECS Transactions

English

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Double-Gate Fully-Depleted SOI Transistors for Low-Power High-Performance Nano-Scale Circuit Design

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A Back-Illuminated Time-Of-Flight Image Sensor With SOI-Based Fully Depleted Detector Technology for LiDAR Application

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Implant Metrology for Bonded SOI Wafers Using a Surface Photo-Voltage Technique

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Very Low Energy Implanted Bragg Gratings in SOI for Wafer Scale Testing Applications

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Challenges of Smaller Particle Detection on Both Bulk-Silicon and SOI Wafers

AIP Conference Proceedings

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Modeling and Control of State-Affine Probabilistic Systems for Atomic-Scale Dynamics

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Fully Integrated SOI Wavelength Meter Based on Phase Shift Technique

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Atomic Scale Catalysts: Atomic Scale Materials for Emerging Robust Catalysis (Small Methods 11/2018)

Materials Science

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Compact Threshold-Voltage Model for Short-Channel Partially-Depleted (PD) SOI Dynamic-Threshold MOS (DTMOS) Devices

IEEE Transactions on Electron Devices

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Magnetic Materials

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