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Publications by Sherif Anas

New Built-In Self-Test Boundary Scan Architectures for Digital Integrated Circuits in Industrial Applications

International Journal of Computer Applications

English

New Automatic Testing Architecture for Integrated Circuits

The International Conference on Electrical Engineering

English

Related publications

A Self-Reconfigurable Platform for Built-In Self-Test Applications

IEEE Transactions on Instrumentation and Measurement

Electronic Engineering

Instrumentation

English

Built-In Self-Test and Self-Calibration for Analog and Mixed Signal Circuits

English

A New Built-In Self Test Scheme for Phase-Locked Loops Using Internal Digital Signals

IEICE Transactions on Electronics

Electronic Engineering

Magnetic Materials

English

Built-In Self Test of High Speed Analog-To-Digital Converters

IEEE Instrumentation and Measurement Magazine

Electronic Engineering

Instrumentation

English

Implementation of Low Power Test Pattern Generator for Digital Integrated Circuits

International Journal of Hybrid Information Technology

Computer Science

English

Built in Self Test for RAM Using VHDL

English

Embedded Built-In-Test Detection Circuit for Radio Frequency Systems and Circuits

English

Test Flow Selection for Stacked Integrated Circuits

Journal of Electronic Testing: Theory and Applications (JETTA)

Electronic Engineering

English

Combined Self-Test of Analog Portion and ADCs in Integrated Mixed-Signal Circuits

IEICE Transactions on Information and Systems

Electronic Engineering

Pattern Recognition

Computer Vision

Artificial Intelligence

English