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Publications by W.M. Baks
Gate Oxide Reliability and Deuterated Cmos Processing
Related publications
Correlation Between Hot Carrier Stress, Oxide Breakdown and Gate Leakage Current for Monitoring Plasma Processing Induced Damage on Gate Oxide
Failure Analysis Using IDD Current Leakage and Photo Localization for Gate Oxide Defect of CMOS VLSI
Mitigation of CMOS Variability With Metal Gate
Electrical Characteristics and Reliability Properties of Metal-Oxide-Semiconductor Field-Effect Transistors With La2O3 Gate Dielectric
Journal of Applied Physics
Astronomy
Physics
Gate Oxide Metrology and Silicon Piezooptics
Thin Solid Films
Surfaces
Alloys
Optical
Interfaces
Metals
Materials Chemistry
Magnetic Materials
Films
Coatings
Electronic
CMOS (Complementary Metal-Oxide-Semiconductor)
Design Techniques for Gate-Leakage Reduction in CMOS Circuits
Molybdenum Gate Electrode Technology for Deep Sub-Micron CMOS Generations
Materials Research Society Symposium - Proceedings
Mechanics of Materials
Materials Science
Condensed Matter Physics
Mechanical Engineering
Design and Characterization of an Integrated CMOS Gate Driver for Vertical Power MOSFETs
