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Publications by Wayne W. Zhao

Minimize Electron Beam Damage During Characterization of Carbon-Depletion in Ultra Low-K Dielectric Materials by STEM EELS Elemental Mapping

Microscopy and Microanalysis

Instrumentation

English

Effectively Characterize Planar-View FinFET Semiconductor Device Etch Uniformity by Introducing Diffraction Contrast in STEM Imaging

Microscopy and Microanalysis

Instrumentation

English

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Parallel EELS Elemental Mapping in Scanning Transmission Electron Microscopy: Use of the Difference Methods

Microscopy Microanalysis Microstructures

English

Elemental Mapping of Co-Pr Nanostructured Powders by EELS Image Filtering

Microscopy and Microanalysis

Instrumentation

English

Quantitative EDX and EELS Elemental Mapping at Atomic Resolution

Microscopy and Microanalysis

Instrumentation

English

Controlling Beam-Sample Interaction in Low Dimensional Materials by Low Dose Rate Electron Microscopy

Microscopy and Microanalysis

Instrumentation

English

Local Elemental and Electronic Structure Analysis Using STEM-EELS

Nihon Kessho Gakkaishi

English

Characterization of Dislocations in Anisotropic Materials by Large Angle Convergent Beam Electron Diffraction

Le Journal de Physique IV

English

Dielectric Characteristics of Low-Permittivity Silicate Using Electron Beam Direct Patterning for Intermetal Dielectric Applications

Applied Physics Letters

English

Aberration-Corrected STEM for Elemental Mapping

Microscopy and Microanalysis

Instrumentation

English

Electrical Characterization of Defects Induced by Electron Beam Exposure in Low Doped N -GaAs

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

High Energy Physics

Instrumentation

English