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Publications by Wen-kuan Yeh

The Improvement of Reliability of High-K/Metal Gate pMOSFET Device With Various PMA Conditions

Active and Passive Electronic Components

Electronic Engineering

Magnetic Materials

English

Related publications

Comprehensive Understanding of PBTI and NBTI Reliability of High-K / Metal Gate Stacks With EOT Scaling to Sub-1nm

English

Random Interface-Traps-Induced Characteristic Fluctuation in 16-Nm High-K/Metal Gate CMOS Device and Digital Circuit

English

The Impact of Positive Bias Temperature Instabilities on Stacked High-K/Metal Gate Transistor With TiN Barrier Layer

English

Intermodulation Linearity in High-K/Metal Gate 28 Nm RF CMOS Transistors

Electronics (Switzerland)

Electronic Engineering

Signal Processing

Computer Networks

Systems Engineering

English

Alternative Surface Passivation on Germanium for Metal-Oxide-Semiconductor Applications With High-K Gate Dielectric

Applied Physics Letters

English

A Study of Low-Frequency Noise on High-K/Metal Gate Stacks With in Situ SiOx Interfacial Layer

English

Lifetime of High-K Gate Dielectrics and Analogy With Strength of Quasibrittle Structures

Journal of Applied Physics

English

Energy-Dispersive X-Ray Spectrum Simulation and Emprical Observation of 22nm Node High-K Metal Gate Structure

Microscopy and Microanalysis

Instrumentation

English

Low-Voltage High-Speed Programming/Erasing Floating-Gate Memory Device With Gate-All-Around Polycrystalline Silicon Nanowire

Applied Physics Letters

English