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Publications by Winston Waller
New Built-In Self-Test Boundary Scan Architectures for Digital Integrated Circuits in Industrial Applications
International Journal of Computer Applications
Related publications
A Self-Reconfigurable Platform for Built-In Self-Test Applications
IEEE Transactions on Instrumentation and Measurement
Electronic Engineering
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Built-In Self-Test and Self-Calibration for Analog and Mixed Signal Circuits
A New Built-In Self Test Scheme for Phase-Locked Loops Using Internal Digital Signals
IEICE Transactions on Electronics
Electronic Engineering
Optical
Electrical
Magnetic Materials
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Built-In Self Test of High Speed Analog-To-Digital Converters
IEEE Instrumentation and Measurement Magazine
Electronic Engineering
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Instrumentation
Implementation of Low Power Test Pattern Generator for Digital Integrated Circuits
International Journal of Hybrid Information Technology
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Built in Self Test for RAM Using VHDL
Embedded Built-In-Test Detection Circuit for Radio Frequency Systems and Circuits
Test Flow Selection for Stacked Integrated Circuits
Journal of Electronic Testing: Theory and Applications (JETTA)
Electronic Engineering
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Combined Self-Test of Analog Portion and ADCs in Integrated Mixed-Signal Circuits
IEICE Transactions on Information and Systems
Electronic Engineering
Pattern Recognition
Hardware
Computer Vision
Electrical
Architecture
Artificial Intelligence
Software
