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Publications in Safety

Drop Impact Reliability of Edge-Bonded Lead-Free Chip Scale Packages

Microelectronics Reliability
SurfacesElectronic EngineeringCondensed Matter PhysicsElectronicMolecular Physics,NanoscienceFilmsOpticalElectricalAtomicMagnetic MaterialsNanotechnologyReliabilitySafetyCoatingsOpticsQualityRisk
2009English

Effect of Hydrogen Peroxide on Sour Cherry Anthocyanins

Journal of Food Quality
QualityReliabilitySafetyRiskFood Science
2000English

Aromatic Compounds in Three Varieties of Turnip Greens Harvested at Three Maturity Levels

Journal of Food Quality
QualityReliabilitySafetyRiskFood Science
2007English

Modelling and Experimental Verification of the Impact of Negative Bias Temperature Instability on CMOS Inverter

Microelectronics Reliability
SurfacesElectronic EngineeringCondensed Matter PhysicsElectronicMolecular Physics,NanoscienceFilmsOpticalElectricalAtomicMagnetic MaterialsNanotechnologyReliabilitySafetyCoatingsOpticsQualityRisk
2009English

Economics of Thick and Thin Film Hybrid Production in Europe

Microelectronics Reliability
SurfacesElectronic EngineeringCondensed Matter PhysicsElectronicMolecular Physics,NanoscienceFilmsOpticalElectricalAtomicMagnetic MaterialsNanotechnologyReliabilitySafetyCoatingsOpticsQualityRisk
1978English

Failure Mechanisms in Beam Lead Semiconductors

Microelectronics Reliability
SurfacesElectronic EngineeringCondensed Matter PhysicsElectronicMolecular Physics,NanoscienceFilmsOpticalElectricalAtomicMagnetic MaterialsNanotechnologyReliabilitySafetyCoatingsOpticsQualityRisk
1977English

The Influence of the Area of a Thin Film Capacitor on the Breakdown Voltage

Microelectronics Reliability
SurfacesElectronic EngineeringCondensed Matter PhysicsElectronicMolecular Physics,NanoscienceFilmsOpticalElectricalAtomicMagnetic MaterialsNanotechnologyReliabilitySafetyCoatingsOpticsQualityRisk
1982English

Evidence for Source Side Injection Hot Carrier Effects on Lateral DMOS Transistors

Microelectronics Reliability
SurfacesElectronic EngineeringCondensed Matter PhysicsElectronicMolecular Physics,NanoscienceFilmsOpticalElectricalAtomicMagnetic MaterialsNanotechnologyReliabilitySafetyCoatingsOpticsQualityRisk
2004English

Design of Wide Band Amplifiers Using Hybrid Integrated Techniques

Microelectronics Reliability
SurfacesElectronic EngineeringCondensed Matter PhysicsElectronicMolecular Physics,NanoscienceFilmsOpticalElectricalAtomicMagnetic MaterialsNanotechnologyReliabilitySafetyCoatingsOpticsQualityRisk
1979English

Configurations of Series-Parallel Networks With Maximum Reliability

Microelectronics Reliability
SurfacesElectronic EngineeringCondensed Matter PhysicsElectronicMolecular Physics,NanoscienceFilmsOpticalElectricalAtomicMagnetic MaterialsNanotechnologyReliabilitySafetyCoatingsOpticsQualityRisk
1996English

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