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Publications by A Craven

Near-Simultaneous Core- And Low-Loss EELS Spectrum-Imaging in the STEM Using a Fast Beam Switch.

Microscopy and Microanalysis

Instrumentation

English

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New Opportunities in Multi-Frame STEM Spectroscopy & Fractional Beam-Current EELS

English

Low-Loss Superconducting Nanowire Circuits Using a Neon Focused Ion Beam

Physical Review Applied

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Atomic-Scale Optical and Vibrational Spectroscopy With Low Loss EELS

Microscopy and Microanalysis

Instrumentation

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Investigation of Electron Beam Induced Mass Loss of Embedding Media in the Low Voltage STEM

Microscopy and Microanalysis

Instrumentation

English

A Low-Loss High-Linearity SOI SP6T Antenna Switch Using Diode Biasing Method

IEICE Electronics Express

Electronic Engineering

Condensed Matter Physics

Magnetic Materials

English

Local Elemental and Electronic Structure Analysis Using STEM-EELS

Nihon Kessho Gakkaishi

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Simultaneous Near-Infrared Diffusive Light and Ultrasound Imaging

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Minimize Electron Beam Damage During Characterization of Carbon-Depletion in Ultra Low-K Dielectric Materials by STEM EELS Elemental Mapping

Microscopy and Microanalysis

Instrumentation

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Fast Electron Beam Guiding for Effective Core Heating

EPJ Web of Conferences

English