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Publications by A. A. Shnyakin
Design for Testability of Integrated Circuits and Project Protection Difficulties
Russian Technological Journal
Related publications
Design of Modular Digital Circuits for Testability
IEEE Transactions on Components, Packaging, and Manufacturing Technology: Part C
Design for Testability of Circuits and Systems; An Overview
The International Conference on Electrical Engineering
Nonscan Design for Testability for Synchronous Sequential Circuits Based on Conflict Resolution
IEEE Transactions on Computers
Hardware
Architecture
Mathematics
Computational Theory
Theoretical Computer Science
Software
Computer-Aided Design for Integrated Circuits
Microelectronics Reliability
Surfaces
Electronic Engineering
Condensed Matter Physics
Electronic
Molecular Physics,
Nanoscience
Films
Optical
Electrical
Atomic
Magnetic Materials
Nanotechnology
Reliability
Safety
Coatings
Optics
Quality
Risk
Distributed ESD Protection for High-Speed Integrated Circuits
IEEE Electron Device Letters
Electronic Engineering
Optical
Electrical
Magnetic Materials
Electronic
Testability Analysis Considerations of Digital Circuits.
Design for Testability of LSI
IEEJ Transactions on Electronics, Information and Systems
Electronic Engineering
Electrical
Cell Transformations and Physical Design Techniques for 3D Monolithic Integrated Circuits
ACM Journal on Emerging Technologies in Computing Systems
Electronic Engineering
Nanoscience
Hardware
Electrical
Architecture
Nanotechnology
Software
Design, Modeling, and Optimization of ECL Interface Circuits for BiCMOS Integrated Systems.
