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Publications by C.R.P. Hartmann
The Effects of Transistor Source-To-Gate Bridging Faults in Complex CMOS Gates
IEEE Journal of Solid-State Circuits
Electronic Engineering
Electrical
Related publications
Logic Testing of Bridging Faults in CMOS Integrated Circuits
IEEE Transactions on Computers
Hardware
Architecture
Mathematics
Computational Theory
Theoretical Computer Science
Software
Double-Gate Two-Step Source/Drain Poly-Si Thin-Film Transistor
Coatings
Surfaces
Films
Coatings
Materials Chemistry
Interfaces
Suppression of Imd3 in Cmos Power Amplifier Using Bias Circuit of Common-Gate Transistor With Cascode Structure
Progress In Electromagnetics Research M
Optical
Electronic
Condensed Matter Physics
Magnetic Materials
Transistor Sizing of Logic Gates to Maximize Input Delay Variability
Journal of Low Power Electronics
Electronic Engineering
Electrical
Systematic Study of Back-Gate Bias Effects in Ultrathin-Box Tri-Gate (UTBT) Transistor With 10nm-Diameter Nanowire Channel
Investigation of Intermittent Resistive Faults in Digital CMOS Circuits
Journal of Circuits, Systems and Computers
Hardware
Electronic Engineering
Electrical
Architecture
Molecular Floating-Gate Single-Electron Transistor
Scientific Reports
Multidisciplinary
Standard CMOS Based One-Time Programmable Switches With Gate-Induced Permanent Source-Drain Path
Learning Logic Gate Through 7-Gates Game
International Journal of Multimedia and Recent Innovation
