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Publications by Seiichi Miyazaki
Theoretical Study on Leakage Current in MOS With High-K Dielectric Stack: Effects of In-Plane-Longitudinal Kinetic Energy Coupling and Anisotropic Masses
Transactions of the Materials Research Society of Japan
Electronic Charged States of Single Si Quantum Dots With Ge Core as Detected by AFM/Kelvin Probe Technique
Comprehensive Understanding of PBTI and NBTI Reliability of High-K / Metal Gate Stacks With EOT Scaling to Sub-1nm
