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Publications by Fahad Ahmed
Reliable Cache Design With Detection of Gate Oxide Breakdown Using BIST
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Correlation Between Hot Carrier Stress, Oxide Breakdown and Gate Leakage Current for Monitoring Plasma Processing Induced Damage on Gate Oxide
Design of Cache Memory With Cache Controller for Low Power
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Soft Breakdown of Hafnium Oxynitride Gate Dielectrics
Journal of Applied Physics
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Design Multipurpose Circuits With Minimum Garbage Outputs Using CMVMIN Gate
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Design of Booth Multiplier Using Double Gate MOSFET
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Evidence of Hole Direct Tunneling Through Ultrathin Gate Oxide Using P/Sup +/ Poly-SiGe Gate
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Energy-Efficient Cache Design Using Variable-Strength Error-Correcting Codes
ACM SIGARCH Computer Architecture News
