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Publications by A. Pradzynski
Impact of Gate Induced Drain Leakage on Overall Leakage of Submicrometer CMOS VLSI Circuits
IEEE Transactions on Semiconductor Manufacturing
Electronic Engineering
Industrial
Condensed Matter Physics
Manufacturing Engineering
Optical
Electrical
Magnetic Materials
Electronic
Related publications
Design Techniques for Gate-Leakage Reduction in CMOS Circuits
Runtime Mechanisms for Leakage Current Reduction in CMOS VLSI Circuits
Simultaneous Control of Subthreshold and Gate Leakage Current in Nanometer-Scale CMOS Circuits
An Algorithm for Leakage Power Reduction Through IVC in CMOS VLSI Digital Circuits
International Journal of Computer Applications
Leakage Current in Deep-Submicron Cmos Circuits
Journal of Circuits, Systems and Computers
Hardware
Electronic Engineering
Electrical
Architecture
Failure Analysis Using IDD Current Leakage and Photo Localization for Gate Oxide Defect of CMOS VLSI
A Gate-Level Leakage Power Reduction Method for Ultra-Low-Power CMOS Circuits
Interface Trap Effect on Gate Induced Drain Leakage Current in Submicron N-MOSFET's
IEEE Transactions on Electron Devices
Electronic Engineering
Optical
Electrical
Magnetic Materials
Electronic
Gate Leakage Reduction by Clocked Power Supply of Adiabatic Logic Circuits
Advances in Radio Science
